BBST Acknowledgements
Many of the courses in the BBST® series are expanded from a graduate-level course taught at Florida Institute of Technology by Cem Kaner.
The initial version of this course was developed by Cem Kaner and Hung Quoc Nguyen in 1994 and offered several times to software testing practitioners through the American Society for Quality (Silicon Valley chapter) and the University of California (UC Extension Berkeley, UC Extension Santa Cruz). Both organizations facilitated collection of extensive peer review. UC Extension also provided courses and some coaching in instructional methods and facilities for alpha testing and beta testing course extensions and improvements.
The course was substantially improved by detailed feedback from James Bach, Sue Bartlett, Elisabeth Hendrickson, Doug Hoffman, Sam Guckenheimer, Bob Johnson, Alan Jorgenson, Brian Lawrence, Paul Szymkowiak, with additional critiques from dozens of other colleagues over a 10-year period in which the course was taught to practitioners as a commercial short course about 110 times and a special version was adapted for use within the Rational Unified Process.
The course was transformed from a commercial short course into a course suitable for university graduate students with the encouragement and guidance of James Whittaker and William Shoaff at Florida Tech and assistance of Ibrahim Ahmad, Sabrina Fay, Rebecca Fiedler, Al Jorgenson, Patrick McGee, Sowmya Padmanabhan, Bret Pettichord, Andy Tinkham, and Giri Vijayaraghavan. James Bach contributed an extensive set of course materials, expanding and refining the course so much that the course is best considered a joint authorship of Kaner and Bach.
Development of the instructional theory underlying the Florida Tech course, and some specific segments, were subsidized by financial support from the National Science Foundation of the United States (grant EIA-0113539 ITR/SY+PE “Improving the Education of Software Testers”), Texas Instruments, and Rational/IBM. Statements in the course and on this site represent the views of the individual authors and not Florida Tech, NSF, IBM, TI, or any of our many colleagues who gave freely of advice but were not able to exercise editorial control.